Commit b6c40b85 authored by NeilBrown's avatar NeilBrown Committed by Greg Kroah-Hartman

w1_bq27000: remove unnecessary NULL test.

As recent change means that we now dereference 'dev' before testing
for NULL.

That means either the change was wrong, or the test isn't needed.
As this function is only called from one driver (bq27x000_battery) and
it always passed a non-NULL dev, it seems good to assume that the
test isn't needed.

So remove it.
Reported-by: default avatarDan Carpenter <dan.carpenter@oracle.com>
Signed-off-by: default avatarNeilBrown <neilb@suse.de>
Acked-by: default avatarEvgeniy Polyakov <zbr@ioremap.net>
Signed-off-by: default avatarGreg Kroah-Hartman <gregkh@linuxfoundation.org>
parent 93518dd2
...@@ -45,9 +45,6 @@ static int w1_bq27000_read(struct device *dev, unsigned int reg) ...@@ -45,9 +45,6 @@ static int w1_bq27000_read(struct device *dev, unsigned int reg)
u8 val; u8 val;
struct w1_slave *sl = container_of(dev->parent, struct w1_slave, dev); struct w1_slave *sl = container_of(dev->parent, struct w1_slave, dev);
if (!dev)
return 0;
w1_write_8(sl->master, HDQ_CMD_READ | reg); w1_write_8(sl->master, HDQ_CMD_READ | reg);
val = w1_read_8(sl->master); val = w1_read_8(sl->master);
......
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