staging: octeon-usb: delete unused cvmx_usbnx_usbp_ctl_status definitions

cvmx_usbnx_usbp_ctl_status was multiplied for different OCTEONS and all
those definitions are unused. Delete them.
Signed-off-by: Aaro Koskinen <aaro.koskinen@iki.fi>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>

drivers/staging/octeon-usb/cvmx-usbnx-defs.h

@@ -498,388 +498,6 @@ union cvmx_usbnx_usbp_ctl_status {
 		uint64_t tdata_in		: 8;
 		uint64_t ate_reset		: 1;
 	} s;
-	/**
-	 * struct cvmx_usbnx_usbp_ctl_status_cn30xx
-	 * @bist_done: PHY Bist Done.
-	 *	Asserted at the end of the PHY BIST sequence.
-	 * @bist_err: PHY Bist Error.
-	 *	Indicates an internal error was detected during
-	 *	the BIST sequence.
-	 * @tdata_out: PHY Test Data Out.
-	 *	Presents either internaly generated signals or
-	 *	test register contents, based upon the value of
-	 *	test_data_out_sel.
-	 * @dma_bmode: When set to 1 the L2C DMA address will be updated
-	 *	with byte-counts between packets. When set to 0
-	 *	the L2C DMA address is incremented to the next
-	 *	4-byte aligned address after adding byte-count.
-	 * @usbc_end: Bigendian input to the USB Core. This should be
-	 *	set to '0' for operation.
-	 * @usbp_bist: PHY, This is cleared '0' to run BIST on the USBP.
-	 * @tclk: PHY Test Clock, used to load TDATA_IN to the USBP.
-	 * @dp_pulld: PHY DP_PULLDOWN input to the USB-PHY.
-	 *	This signal enables the pull-down resistance on
-	 *	the D+ line. '1' pull down-resistance is connected
-	 *	to D+/ '0' pull down resistance is not connected
-	 *	to D+. When an A/B device is acting as a host
-	 *	(downstream-facing port), dp_pulldown and
-	 *	dm_pulldown are enabled. This must not toggle
-	 *	during normal opeartion.
-	 * @dm_pulld: PHY DM_PULLDOWN input to the USB-PHY.
-	 *	This signal enables the pull-down resistance on
-	 *	the D- line. '1' pull down-resistance is connected
-	 *	to D-. '0' pull down resistance is not connected
-	 *	to D-. When an A/B device is acting as a host
-	 *	(downstream-facing port), dp_pulldown and
-	 *	dm_pulldown are enabled. This must not toggle
-	 *	during normal opeartion.
-	 * @hst_mode: When '0' the USB is acting as HOST, when '1'
-	 *	USB is acting as device. This field needs to be
-	 *	set while the USB is in reset.
-	 * @tuning: Transmitter Tuning for High-Speed Operation.
-	 *	Tunes the current supply and rise/fall output
-	 *	times for high-speed operation.
-	 *	[20:19] == 11: Current supply increased
-	 *	approximately 9%
-	 *	[20:19] == 10: Current supply increased
-	 *	approximately 4.5%
-	 *	[20:19] == 01: Design default.
-	 *	[20:19] == 00: Current supply decreased
-	 *	approximately 4.5%
-	 *	[22:21] == 11: Rise and fall times are increased.
-	 *	[22:21] == 10: Design default.
-	 *	[22:21] == 01: Rise and fall times are decreased.
-	 *	[22:21] == 00: Rise and fall times are decreased
-	 *	further as compared to the 01 setting.
-	 * @tx_bs_enh: Transmit Bit Stuffing on [15:8].
-	 *	Enables or disables bit stuffing on data[15:8]
-	 *	when bit-stuffing is enabled.
-	 * @tx_bs_en: Transmit Bit Stuffing on [7:0].
-	 *	Enables or disables bit stuffing on data[7:0]
-	 *	when bit-stuffing is enabled.
-	 * @loop_enb: PHY Loopback Test Enable.
-	 *	'1': During data transmission the receive is
-	 *	enabled.
-	 *	'0': During data transmission the receive is
-	 *	disabled.
-	 *	Must be '0' for normal operation.
-	 * @vtest_enb: Analog Test Pin Enable.
-	 *	'1' The PHY's analog_test pin is enabled for the
-	 *	input and output of applicable analog test signals.
-	 *	'0' THe analog_test pin is disabled.
-	 * @bist_enb: Built-In Self Test Enable.
-	 *	Used to activate BIST in the PHY.
-	 * @tdata_sel: Test Data Out Select.
-	 *	'1' test_data_out[3:0] (PHY) register contents
-	 *	are output. '0' internaly generated signals are
-	 *	output.
-	 * @taddr_in: Mode Address for Test Interface.
-	 *	Specifies the register address for writing to or
-	 *	reading from the PHY test interface register.
-	 * @tdata_in: Internal Testing Register Input Data and Select
-	 *	This is a test bus. Data is present on [3:0],
-	 *	and its corresponding select (enable) is present
-	 *	on bits [7:4].
-	 * @ate_reset: Reset input from automatic test equipment.
-	 *	This is a test signal. When the USB Core is
-	 *	powered up (not in Susned Mode), an automatic
-	 *	tester can use this to disable phy_clock and
-	 *	free_clk, then re-eanable them with an aligned
-	 *	phase.
-	 *	'1': The phy_clk and free_clk outputs are
-	 *	disabled. "0": The phy_clock and free_clk outputs
-	 *	are available within a specific period after the
-	 *	de-assertion.
-	 */
-	struct cvmx_usbnx_usbp_ctl_status_cn30xx {
-		uint64_t reserved_38_63	: 26;
-		uint64_t bist_done	: 1;
-		uint64_t bist_err	: 1;
-		uint64_t tdata_out	: 4;
-		uint64_t reserved_30_31	: 2;
-		uint64_t dma_bmode	: 1;
-		uint64_t usbc_end	: 1;
-		uint64_t usbp_bist	: 1;
-		uint64_t tclk		: 1;
-		uint64_t dp_pulld	: 1;
-		uint64_t dm_pulld	: 1;
-		uint64_t hst_mode	: 1;
-		uint64_t tuning		: 4;
-		uint64_t tx_bs_enh	: 1;
-		uint64_t tx_bs_en	: 1;
-		uint64_t loop_enb	: 1;
-		uint64_t vtest_enb	: 1;
-		uint64_t bist_enb	: 1;
-		uint64_t tdata_sel	: 1;
-		uint64_t taddr_in	: 4;
-		uint64_t tdata_in	: 8;
-		uint64_t ate_reset	: 1;
-	} cn30xx;
-	/**
-	 * struct cvmx_usbnx_usbp_ctl_status_cn50xx
-	 * @txrisetune: HS Transmitter Rise/Fall Time Adjustment
-	 * @txvreftune: HS DC Voltage Level Adjustment
-	 * @txfslstune: FS/LS Source Impedence Adjustment
-	 * @txhsxvtune: Transmitter High-Speed Crossover Adjustment
-	 * @sqrxtune: Squelch Threshold Adjustment
-	 * @compdistune: Disconnect Threshold Adjustment
-	 * @otgtune: VBUS Valid Threshold Adjustment
-	 * @otgdisable: OTG Block Disable
-	 * @portreset: Per_Port Reset
-	 * @drvvbus: Drive VBUS
-	 * @lsbist: Low-Speed BIST Enable.
-	 * @fsbist: Full-Speed BIST Enable.
-	 * @hsbist: High-Speed BIST Enable.
-	 * @bist_done: PHY Bist Done.
-	 *	Asserted at the end of the PHY BIST sequence.
-	 * @bist_err: PHY Bist Error.
-	 *	Indicates an internal error was detected during
-	 *	the BIST sequence.
-	 * @tdata_out: PHY Test Data Out.
-	 *	Presents either internaly generated signals or
-	 *	test register contents, based upon the value of
-	 *	test_data_out_sel.
-	 * @txpreemphasistune: HS Transmitter Pre-Emphasis Enable
-	 * @dma_bmode: When set to 1 the L2C DMA address will be updated
-	 *	with byte-counts between packets. When set to 0
-	 *	the L2C DMA address is incremented to the next
-	 *	4-byte aligned address after adding byte-count.
-	 * @usbc_end: Bigendian input to the USB Core. This should be
-	 *	set to '0' for operation.
-	 * @usbp_bist: PHY, This is cleared '0' to run BIST on the USBP.
-	 * @tclk: PHY Test Clock, used to load TDATA_IN to the USBP.
-	 * @dp_pulld: PHY DP_PULLDOWN input to the USB-PHY.
-	 *	This signal enables the pull-down resistance on
-	 *	the D+ line. '1' pull down-resistance is connected
-	 *	to D+/ '0' pull down resistance is not connected
-	 *	to D+. When an A/B device is acting as a host
-	 *	(downstream-facing port), dp_pulldown and
-	 *	dm_pulldown are enabled. This must not toggle
-	 *	during normal opeartion.
-	 * @dm_pulld: PHY DM_PULLDOWN input to the USB-PHY.
-	 *	This signal enables the pull-down resistance on
-	 *	the D- line. '1' pull down-resistance is connected
-	 *	to D-. '0' pull down resistance is not connected
-	 *	to D-. When an A/B device is acting as a host
-	 *	(downstream-facing port), dp_pulldown and
-	 *	dm_pulldown are enabled. This must not toggle
-	 *	during normal opeartion.
-	 * @hst_mode: When '0' the USB is acting as HOST, when '1'
-	 *	USB is acting as device. This field needs to be
-	 *	set while the USB is in reset.
-	 * @tx_bs_enh: Transmit Bit Stuffing on [15:8].
-	 *	Enables or disables bit stuffing on data[15:8]
-	 *	when bit-stuffing is enabled.
-	 * @tx_bs_en: Transmit Bit Stuffing on [7:0].
-	 *	Enables or disables bit stuffing on data[7:0]
-	 *	when bit-stuffing is enabled.
-	 * @loop_enb: PHY Loopback Test Enable.
-	 *	'1': During data transmission the receive is
-	 *	enabled.
-	 *	'0': During data transmission the receive is
-	 *	disabled.
-	 *	Must be '0' for normal operation.
-	 * @vtest_enb: Analog Test Pin Enable.
-	 *	'1' The PHY's analog_test pin is enabled for the
-	 *	input and output of applicable analog test signals.
-	 *	'0' THe analog_test pin is disabled.
-	 * @bist_enb: Built-In Self Test Enable.
-	 *	Used to activate BIST in the PHY.
-	 * @tdata_sel: Test Data Out Select.
-	 *	'1' test_data_out[3:0] (PHY) register contents
-	 *	are output. '0' internaly generated signals are
-	 *	output.
-	 * @taddr_in: Mode Address for Test Interface.
-	 *	Specifies the register address for writing to or
-	 *	reading from the PHY test interface register.
-	 * @tdata_in: Internal Testing Register Input Data and Select
-	 *	This is a test bus. Data is present on [3:0],
-	 *	and its corresponding select (enable) is present
-	 *	on bits [7:4].
-	 * @ate_reset: Reset input from automatic test equipment.
-	 *	This is a test signal. When the USB Core is
-	 *	powered up (not in Susned Mode), an automatic
-	 *	tester can use this to disable phy_clock and
-	 *	free_clk, then re-eanable them with an aligned
-	 *	phase.
-	 *	'1': The phy_clk and free_clk outputs are
-	 *	disabled. "0": The phy_clock and free_clk outputs
-	 *	are available within a specific period after the
-	 *	de-assertion.
-	 */
-	struct cvmx_usbnx_usbp_ctl_status_cn50xx {
-		uint64_t txrisetune		: 1;
-		uint64_t txvreftune		: 4;
-		uint64_t txfslstune		: 4;
-		uint64_t txhsxvtune		: 2;
-		uint64_t sqrxtune		: 3;
-		uint64_t compdistune		: 3;
-		uint64_t otgtune		: 3;
-		uint64_t otgdisable		: 1;
-		uint64_t portreset		: 1;
-		uint64_t drvvbus		: 1;
-		uint64_t lsbist			: 1;
-		uint64_t fsbist			: 1;
-		uint64_t hsbist			: 1;
-		uint64_t bist_done		: 1;
-		uint64_t bist_err		: 1;
-		uint64_t tdata_out		: 4;
-		uint64_t reserved_31_31		: 1;
-		uint64_t txpreemphasistune	: 1;
-		uint64_t dma_bmode		: 1;
-		uint64_t usbc_end		: 1;
-		uint64_t usbp_bist		: 1;
-		uint64_t tclk			: 1;
-		uint64_t dp_pulld		: 1;
-		uint64_t dm_pulld		: 1;
-		uint64_t hst_mode		: 1;
-		uint64_t reserved_19_22		: 4;
-		uint64_t tx_bs_enh		: 1;
-		uint64_t tx_bs_en		: 1;
-		uint64_t loop_enb		: 1;
-		uint64_t vtest_enb		: 1;
-		uint64_t bist_enb		: 1;
-		uint64_t tdata_sel		: 1;
-		uint64_t taddr_in		: 4;
-		uint64_t tdata_in		: 8;
-		uint64_t ate_reset		: 1;
-	} cn50xx;
-	/**
-	 * struct cvmx_usbnx_usbp_ctl_status_cn52xx
-	 * @txrisetune: HS Transmitter Rise/Fall Time Adjustment
-	 * @txvreftune: HS DC Voltage Level Adjustment
-	 * @txfslstune: FS/LS Source Impedence Adjustment
-	 * @txhsxvtune: Transmitter High-Speed Crossover Adjustment
-	 * @sqrxtune: Squelch Threshold Adjustment
-	 * @compdistune: Disconnect Threshold Adjustment
-	 * @otgtune: VBUS Valid Threshold Adjustment
-	 * @otgdisable: OTG Block Disable
-	 * @portreset: Per_Port Reset
-	 * @drvvbus: Drive VBUS
-	 * @lsbist: Low-Speed BIST Enable.
-	 * @fsbist: Full-Speed BIST Enable.
-	 * @hsbist: High-Speed BIST Enable.
-	 * @bist_done: PHY Bist Done.
-	 *	Asserted at the end of the PHY BIST sequence.
-	 * @bist_err: PHY Bist Error.
-	 *	Indicates an internal error was detected during
-	 *	the BIST sequence.
-	 * @tdata_out: PHY Test Data Out.
-	 *	Presents either internaly generated signals or
-	 *	test register contents, based upon the value of
-	 *	test_data_out_sel.
-	 * @siddq: Drives the USBP (USB-PHY) SIDDQ input.
-	 *	Normally should be set to zero.
-	 *	When customers have no intent to use USB PHY
-	 *	interface, they should:
-	 *	- still provide 3.3V to USB_VDD33, and
-	 *	- tie USB_REXT to 3.3V supply, and
-	 *	- set USBN*_USBP_CTL_STATUS[SIDDQ]=1
-	 * @txpreemphasistune: HS Transmitter Pre-Emphasis Enable
-	 * @dma_bmode: When set to 1 the L2C DMA address will be updated
-	 *	with byte-counts between packets. When set to 0
-	 *	the L2C DMA address is incremented to the next
-	 *	4-byte aligned address after adding byte-count.
-	 * @usbc_end: Bigendian input to the USB Core. This should be
-	 *	set to '0' for operation.
-	 * @usbp_bist: PHY, This is cleared '0' to run BIST on the USBP.
-	 * @tclk: PHY Test Clock, used to load TDATA_IN to the USBP.
-	 * @dp_pulld: PHY DP_PULLDOWN input to the USB-PHY.
-	 *	This signal enables the pull-down resistance on
-	 *	the D+ line. '1' pull down-resistance is connected
-	 *	to D+/ '0' pull down resistance is not connected
-	 *	to D+. When an A/B device is acting as a host
-	 *	(downstream-facing port), dp_pulldown and
-	 *	dm_pulldown are enabled. This must not toggle
-	 *	during normal opeartion.
-	 * @dm_pulld: PHY DM_PULLDOWN input to the USB-PHY.
-	 *	This signal enables the pull-down resistance on
-	 *	the D- line. '1' pull down-resistance is connected
-	 *	to D-. '0' pull down resistance is not connected
-	 *	to D-. When an A/B device is acting as a host
-	 *	(downstream-facing port), dp_pulldown and
-	 *	dm_pulldown are enabled. This must not toggle
-	 *	during normal opeartion.
-	 * @hst_mode: When '0' the USB is acting as HOST, when '1'
-	 *	USB is acting as device. This field needs to be
-	 *	set while the USB is in reset.
-	 * @tx_bs_enh: Transmit Bit Stuffing on [15:8].
-	 *	Enables or disables bit stuffing on data[15:8]
-	 *	when bit-stuffing is enabled.
-	 * @tx_bs_en: Transmit Bit Stuffing on [7:0].
-	 *	Enables or disables bit stuffing on data[7:0]
-	 *	when bit-stuffing is enabled.
-	 * @loop_enb: PHY Loopback Test Enable.
-	 *	'1': During data transmission the receive is
-	 *	enabled.
-	 *	'0': During data transmission the receive is
-	 *	disabled.
-	 *	Must be '0' for normal operation.
-	 * @vtest_enb: Analog Test Pin Enable.
-	 *	'1' The PHY's analog_test pin is enabled for the
-	 *	input and output of applicable analog test signals.
-	 *	'0' THe analog_test pin is disabled.
-	 * @bist_enb: Built-In Self Test Enable.
-	 *	Used to activate BIST in the PHY.
-	 * @tdata_sel: Test Data Out Select.
-	 *	'1' test_data_out[3:0] (PHY) register contents
-	 *	are output. '0' internaly generated signals are
-	 *	output.
-	 * @taddr_in: Mode Address for Test Interface.
-	 *	Specifies the register address for writing to or
-	 *	reading from the PHY test interface register.
-	 * @tdata_in: Internal Testing Register Input Data and Select
-	 *	This is a test bus. Data is present on [3:0],
-	 *	and its corresponding select (enable) is present
-	 *	on bits [7:4].
-	 * @ate_reset: Reset input from automatic test equipment.
-	 *	This is a test signal. When the USB Core is
-	 *	powered up (not in Susned Mode), an automatic
-	 *	tester can use this to disable phy_clock and
-	 *	free_clk, then re-eanable them with an aligned
-	 *	phase.
-	 *	'1': The phy_clk and free_clk outputs are
-	 *	disabled. "0": The phy_clock and free_clk outputs
-	 *	are available within a specific period after the
-	 *	de-assertion.
-	 */
-	struct cvmx_usbnx_usbp_ctl_status_cn52xx {
-		uint64_t txrisetune		: 1;
-		uint64_t txvreftune		: 4;
-		uint64_t txfslstune		: 4;
-		uint64_t txhsxvtune		: 2;
-		uint64_t sqrxtune		: 3;
-		uint64_t compdistune		: 3;
-		uint64_t otgtune		: 3;
-		uint64_t otgdisable		: 1;
-		uint64_t portreset		: 1;
-		uint64_t drvvbus		: 1;
-		uint64_t lsbist			: 1;
-		uint64_t fsbist			: 1;
-		uint64_t hsbist			: 1;
-		uint64_t bist_done		: 1;
-		uint64_t bist_err		: 1;
-		uint64_t tdata_out		: 4;
-		uint64_t siddq			: 1;
-		uint64_t txpreemphasistune	: 1;
-		uint64_t dma_bmode		: 1;
-		uint64_t usbc_end		: 1;
-		uint64_t usbp_bist		: 1;
-		uint64_t tclk			: 1;
-		uint64_t dp_pulld		: 1;
-		uint64_t dm_pulld		: 1;
-		uint64_t hst_mode		: 1;
-		uint64_t reserved_19_22		: 4;
-		uint64_t tx_bs_enh		: 1;
-		uint64_t tx_bs_en		: 1;
-		uint64_t loop_enb		: 1;
-		uint64_t vtest_enb		: 1;
-		uint64_t bist_enb		: 1;
-		uint64_t tdata_sel		: 1;
-		uint64_t taddr_in		: 4;
-		uint64_t tdata_in		: 8;
-		uint64_t ate_reset		: 1;
-	} cn52xx;
 };
 
 #endif