Structural Based Functional Test at Field (SBAF) is a new type of
testing that provides comprehensive core test coverage complementing
existing IFS tests like Scan at Field (SAF) or ArrayBist.

SBAF device will appear as a new device instance (intel_ifs_2) under
/sys/devices/virtual/misc. The user interaction necessary to load the
test image and test a particular core is the same as the existing scan
test (intel_ifs_0).

During the loading stage, the driver will look for a file named
ff-mm-ss-<batch02x>.sbft in the /lib/firmware/intel/ifs_2 directory.
The hardware interaction needed for loading the image is similar to
SAF, with the only difference being the MSR addresses used. Reuse the
SAF image loading code, passing the SBAF-specific MSR addresses via
struct ifs_test_msrs in the driver device data.

Unlike SAF, the SBAF test image chunks are further divided into smaller
logical entities called bundles. Since the SBAF test is initiated per
bundle, cache the maximum number of bundles in the current image, which
is used for iterating through bundles during SBAF test execution.
Reviewed-by: Ashok Raj <ashok.raj@intel.com>
Reviewed-by: Tony Luck <tony.luck@intel.com>
Reviewed-by: Ilpo Järvinen <ilpo.jarvinen@linux.intel.com>
Signed-off-by: Jithu Joseph <jithu.joseph@intel.com>
Co-developed-by: Kuppuswamy Sathyanarayanan <sathyanarayanan.kuppuswamy@linux.intel.com>
Signed-off-by: Kuppuswamy Sathyanarayanan <sathyanarayanan.kuppuswamy@linux.intel.com>
Link: https://lore.kernel.org/r/20240801051814.1935149-3-sathyanarayanan.kuppuswamy@linux.intel.comSigned-off-by: Hans de Goede <hdegoede@redhat.com>