platform/x86/intel/ifs: Introduce Array Scan test to IFS
Array BIST is a new type of core test introduced under the Intel Infield Scan (IFS) suite of tests. Emerald Rapids (EMR) is the first CPU to support Array BIST. Array BIST performs tests on some portions of the core logic such as caches and register files. These are different portions of the silicon compared to the parts tested by the first test type i.e Scan at Field (SAF). Make changes in the device driver init flow to register this new test type with the device driver framework. Each test will have its own sysfs directory (intel_ifs_0 , intel_ifs_1) under misc hierarchy to accommodate for the differences in test type and how they are initiated. Upcoming patches will add actual support. Signed-off-by: Jithu Joseph <jithu.joseph@intel.com> Reviewed-by: Tony Luck <tony.luck@intel.com> Link: https://lore.kernel.org/r/20230322003359.213046-6-jithu.joseph@intel.comReviewed-by: Hans de Goede <hdegoede@redhat.com> Signed-off-by: Hans de Goede <hdegoede@redhat.com>
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