media: imx258: remove test pattern map from driver
change bayer order when using test pattern mode. remove test pattern mapping method [Sakari Ailus: Drop extra added newline] Signed-off-by: Chen, JasonX Z <jasonx.z.chen@intel.com> Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com> Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>
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