Commit 75d22b32 authored by Johan Hovold's avatar Johan Hovold Committed by Greg Kroah-Hartman

USB: keyspan_pda: remove bogus disconnect test in close

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.
Signed-off-by: default avatarJohan Hovold <jhovold@gmail.com>
Signed-off-by: default avatarGreg Kroah-Hartman <gregkh@linuxfoundation.org>
parent d7f08452
......@@ -649,13 +649,8 @@ static int keyspan_pda_open(struct tty_struct *tty,
}
static void keyspan_pda_close(struct usb_serial_port *port)
{
struct usb_serial *serial = port->serial;
if (serial->dev) {
/* shutdown our bulk reads and writes */
usb_kill_urb(port->write_urb);
usb_kill_urb(port->interrupt_in_urb);
}
usb_kill_urb(port->write_urb);
usb_kill_urb(port->interrupt_in_urb);
}
......
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